The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Jul. 12, 2006
Volker Zipprich-rasch, Dresden, DE;
Volker Zipprich-Rasch, Dresden, DE;
Infineon Technologies Flash GmbH & Co. KG, Dresden, DE;
Abstract
A method includes an initial process of selecting a memory cell within the memory array and an operating condition under which the memory cell is to be tested. The memory cell is tested under the specified operating condition, and a measured response obtained therefrom. Based upon the measured response, a determination is made as to whether the memory cell passes or fails a predetermined criterion. The pass/fail result is communicated to a counter that is integrated on-chip with the memory array, the counter operable to accumulate a total number of pass or fail results supplied thereto. The aforementioned processes are repeated for at least one different memory cell, whereby the new memory cell is tested under the aforementioned operating conditions. Subsequently, a data value representing the accumulated number of pass or fail results is output from the on-chip counter.