The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Sep. 27, 2001
Shih-zheng Kuo, Taipei Hsien, TW;
Shih-Zheng Kuo, Taipei Hsien, TW;
Transpacific IP, Ltd., Taipei, TW;
Abstract
An automatic scanning parameter setting device and method. The automatic scanning parameter setting device is a scanner that automatically sets the scanning parameters of a plurality of scan images so that scanning can be conducted in batches. The automatic scanning parameter setting device includes an image input device, an analysis device and a control unit. The image input device is attached to the scanner for inputting a plurality of scan images. A portion of the scan images contains a set parameter format. The set parameter format contains a plurality of scanning parameter values. The analysis device performs an analysis of the scan images containing recorded scan parameter values. The control unit uses the analyzed scanning parameter values to conduct a scanning parameter setting operation on the scan images having recorded scanning parameter values as well as the ordered scan images after the scan images with recorded scan parameter values but without recorded scan parameter values.