The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Jun. 15, 2006
Yuichi Tomaru, Kanagawa-ken, JP;
Yuichi Tomaru, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A fluid analysis element includes: a semi transmissive/semi reflective first reflector; a transmissive apertured member, having a plurality of apertures, with diameters sufficiently smaller than the wavelength of measuring light, formed therein for holding a fluid sample; and a second reflector, which is fully reflective or semi transmissive/semi reflective. The first reflector, the transmissive apertured member, and the second reflector are provided in this order from the side of the element into which the measuring light enters. Emitted light is emitted from the first reflector or the second reflector. The element displays absorption properties that absorb light of specific wavelengths according to the mean complex refractive indices of the first and second reflectors, and the mean complex refractive index and the thickness of the transmissive apertured member. Analysis of the fluid sample is performed by detecting physical properties or changes in physical properties that occur according to the absorption properties.