The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Mar. 21, 2005
Wayne D Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Alan R. Loudermilk, Chicago, IL (US);
Wayne D Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Alan R. Loudermilk, Chicago, IL (US);
JJL Technologies LLC, Morton Grove, IL (US);
Abstract
A method for determining spectral characteristics of an object is disclosed. A probe is positioned in proximity relative to the object. The probe provides light from at least first and second light sources positioned first and second distances from a central light receiver. The first light source and the central light receiver define a first critical height from the surface below which no specularly reflected light from the first light source is received by the central light receiver, and the second light source and the central light receiver define a second critical height from the surface below which no specularly reflected light from the second light source is received by the central light receiver. The first critical height is different from the second critical height.