The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

May. 02, 2005
Applicants:

Surapong Lertrattanapanich, Santa Ana, CA (US);

Yeong-taeg Kim, Irvine, CA (US);

Inventors:

Surapong Lertrattanapanich, Santa Ana, CA (US);

Yeong-Taeg Kim, Irvine, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/01 (2006.01); H04N 11/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting the Bisection pattern for use in conjunction with the deinterlacing is to improve low angle direction detection capability. A method of Bisection pattern detection operates in an interlaced video containing both top and bottom fields. For each missing pixel in a current input field, a window W is constructed whose center pixel is at the considered missing pixel. A binary map is generated which includes rows of values corresponding to pixels in the window, wherein the values indicate if each element of the window is greater than the sample mean of the area surrounding the missing pixel. The number of value changes in the values in each row of the binary map is counted. It is then determined whether or not the missing pixel is within the Bisection pattern based on said counts. In order to maintain both the low angle edge direction detection capability and low misdetection probability, complicated areas are identified by the Bisection pattern detection method. Then deinterlacing is performed.


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Lertrattanapanich, Surapong. (2008). Method for detecting bisection pattern in deinterlacing (U.S. Patent No. 7403234). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7403234

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