The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7403021 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 22, 2008

Filed:

Sep. 11, 2006
Applicants:

Yi-cai Tan, Shenzhen, CN;

Ren-jun Xiao, Shenzhen, CN;

Kun-lung Wu, Tu-Cheng, TW;

Inventors:

Yi-Cai Tan, Shenzhen, CN;

Ren-Jun Xiao, Shenzhen, CN;

Kun-Lung Wu, Tu-Cheng, TW;

Assignees:

Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Bao-an District, Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing circuit for an interface includes a load feeding circuit and a voltage testing circuit. The load feeding circuit includes a resistance-regulating unit, a first comparator, a pass element, and a capacitor. The resistance-regulating unit is connected to a positive input of the first comparator. A negative input of the first comparator is connected to the capacitor and a first terminal of the pass element. An output of the first comparator is connected to a second terminal of the pass element. A third terminal of the pass element is connected to the interface. The voltage testing circuit includes a second comparator and a display member connected to the second comparator. The voltage of the interface and a reference voltage are input to inputs of the second comparator, and the second comparator outputs a signal to control the display member to display a comparison result.


Find Patent Forward Citations

Tan, Yi-Cai. (2008). Testing circuit for a data interface (U.S. Patent No. 7403021). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7403021

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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