The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Oct. 06, 2004
Daniel Gagnon, Twinsburg, OH (US);
Jerome J. Griesmer, Mentor, OH (US);
Daniel Gagnon, Twinsburg, OH (US);
Jerome J. Griesmer, Mentor, OH (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A system reverses degraded energy resolution of semiconductor radiation detection elements () which are used in a radiation detector assembly. A means () identifies semiconductor elements which exhibit degraded energy resolution as compared to an initial level of energy resolution after application of the forward bias. A means () restores the degraded semiconductor elements to the initial level of energy resolution by applying the reverse bias. A heater () accelerates the restoration process by supplying an elevated ambient temperature. A screening means () screens new semiconductor elements to identify the elements which are susceptible to degradation. A forward bias is applied by a forward bias means () to induce the degradation. A heater () increases an ambient temperature to accelerate the performance degradation in the new semiconductor elements. The identified degradable elements are treated with a reverse bias prior to installation in the detector.