The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Dec. 23, 2005
Applicants:

Wonkyu Moon, Gyeongsangbuk-do, KR;

Geunbae Lim, Suwon-si, KR;

Sang Hoon Lee, Daegu, KR;

Inventors:

Wonkyu Moon, Gyeongsangbuk-do, KR;

Geunbae Lim, Suwon-si, KR;

Sang Hoon Lee, Daegu, KR;

Assignee:

POSTECH Foundation, Kyungsangbuk-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01N 23/00 (2006.01); D01F 9/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the present invention provides a method for fabricating a probe having a field effect transistor channel structure including fabricating a field effect transistor, making preparations for growing a carbon nanotube at a top portion of a gate electrode of the field effect transistor, and generating the carbon nanotube at the top portion of the gate electrode of the field effect transistor.


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