The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2008

Filed:

Jun. 07, 2006
Applicants:

Martin Fuchs, Uxbridge, MA (US);

John Harris, Foxboro, MA (US);

Ray Meyer, Wakefield, MA (US);

Inventors:

Martin Fuchs, Uxbridge, MA (US);

John Harris, Foxboro, MA (US);

Ray Meyer, Wakefield, MA (US);

Assignee:

U.S. Genomics, Inc., Woburn, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); C07H 21/02 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection system and methods for improving the ability of the detection system to recognize labels that are disposed on a polymer. Embodiments of the invention include schemes for selecting emitters and labels used within the system in a manner that allows an increase in the number of distinct labels that can be used together in a system. In other embodiments, the detection system and methods are directed to identifying portions of a detection signal that may be associated with extra labels residing within a detection zone. In other embodiments, the detection system and methods relate to using wide field imaging detectors while reducing out of focus noise contributions to detection signals of the system. Still, other embodiments relate to the use of linear array detectors to detect labels.


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