The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Aug. 25, 2000
Applicants:
Jerry Schlagheck, West Chester, OH (US);
Marc Pastor, Saint-Hubert, CA;
Inventors:
Jerry Schlagheck, West Chester, OH (US);
Marc Pastor, Saint-Hubert, CA;
Assignee:
ART Advanced Research Technologies Inc., Saint-Laurent, Quebec, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
Abstract
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of said populated sample having one or more Surface Mounted Components. The mechanism exploits a standard thermographic image which may be used in a detection method comprising