The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Aug. 28, 2002
Applicants:
Hartmut Vogelsang, Jena, DE;
Michael Bergt, Jena, DE;
Manfred Dick, Gefell, DE;
Holger Maeusezahl, Jena, DE;
Eckhard Schroeder, Eckental, DE;
Inventors:
Hartmut Vogelsang, Jena, DE;
Michael Bergt, Jena, DE;
Manfred Dick, Gefell, DE;
Holger Maeusezahl, Jena, DE;
Eckhard Schroeder, Eckental, DE;
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for measuring the dynamic behavior of an optical system is aimed at rendering the dynamic behavior of the optical system objectively detectable. To this end, the optical system to be measured is stimulated by stimuli whereby causing it to react, and the reaction is detected by means of a wave front analysis.