The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Apr. 24, 2006
Charles Earl Markham, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Paul D. Fuller, Menasha, WI (US);
John Harland Hise, Neenah, WI (US);
Sheryl Annette Ihde, Greenville, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Flynn Matthew Tiffany, Layton, UT (US);
Roger Dale Yosten, Sumner, TX (US);
Charles Earl Markham, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Paul D. Fuller, Menasha, WI (US);
John Harland Hise, Neenah, WI (US);
Sheryl Annette Ihde, Greenville, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Flynn Matthew Tiffany, Layton, UT (US);
Roger Dale Yosten, Sumner, TX (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
Communication between machines in an event-based manufacturing system. In an event-based manufacturing system, material-specific data obtained for a material produced during a first manufacturing operation is used to govern a second manufacturing operation to decrease the likelihood of at least a delay event, a waste event, or poor quality of the product.