The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7401276 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 15, 2008

Filed:

Dec. 23, 2005
Applicants:

Katsuhide Matsumoto, Kanagawa, JP;

Masaaki Souda, Kanagawa, JP;

Masafumi Mitsuishi, Kanagawa, JP;

Shingo Sakai, Kanagawa, JP;

Hiromu Katou, Kanagawa, JP;

Inventors:

Katsuhide Matsumoto, Kanagawa, JP;

Masaaki Souda, Kanagawa, JP;

Masafumi Mitsuishi, Kanagawa, JP;

Shingo Sakai, Kanagawa, JP;

Hiromu Katou, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes an output path; an input path; and a test signal generating circuit. The test signal generating circuit generates an input test data signal by changing at least one of an amplitude and a phase of an output test data signal which is generated from a test data in the semiconductor device and transferred on the output path, and supplies the input test data signal onto the input path. The output path and the input path are tested by using the output test data signal and the input test data signal, respectively.


Find Patent Forward Citations

Matsumoto, Katsuhide. (2008). Semiconductor device with test circuit and test method of the same (U.S. Patent No. 7401276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7401276

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