The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
May. 19, 2005
Andrew J. Dubois, Jr., Howey-in-The-Hills, FL (US);
Vaughn Robert Evans, Cary, NC (US);
David L. Jensen, Peekskill, NY (US);
Ildar Khabibrakhmanov, Syosset, NY (US);
Stephen Restivo, Chapel Hill, NC (US);
Christopher D. Ross, Cary, NC (US);
Emmanuel Yashchin, Yorktown Heights, NY (US);
Andrew J. Dubois, Jr., Howey-in-The-Hills, FL (US);
Vaughn Robert Evans, Cary, NC (US);
David L. Jensen, Peekskill, NY (US);
Ildar Khabibrakhmanov, Syosset, NY (US);
Stephen Restivo, Chapel Hill, NC (US);
Christopher D. Ross, Cary, NC (US);
Emmanuel Yashchin, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for detecting trends in time-managed lifetime data for products shipped in distinct vintages within a time window. Data is consolidated from several sources and represented in a form amenable to detection of trends using a criterion for measuring failure. A weight is applied to the failure measures, the weight increasing over the time the products are in the time window. A function of weighted failures is used to define a severity index for proximity to an unacceptable level of failures, and an alarm signal is triggered at a threshold level that allows the level of false alarms to be pre-set.