The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Apr. 20, 2005
Applicants:

Jan L. Bonebakker, Mountain View, CA (US);

Ilya Gluhovsky, Mountain View, CA (US);

Inventors:

Jan L. Bonebakker, Mountain View, CA (US);

Ilya Gluhovsky, Mountain View, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01); G06F 15/177 (2006.01); G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention provides a system that characterizes computer system workloads. During operation, the system collects metrics for a number of workloads of interest as the workloads of interest execute on a computer system. Next, the system uses the collected metrics to build a statistical regression model, wherein the statistical regression model uses a performance indicator as a response, and uses the metrics as predictors. The system then defines a distance metric between workloads, wherein the distance between two workloads is a function of the differences between metric values for the two workloads. Furthermore, these differences are weighted by corresponding coefficients for the metric values in the statistical regression model.


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