The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Jul. 08, 2004
Applicants:

Heinz Mattes, München, DE;

Sebastian Sattler, München, DE;

Inventors:

Heinz Mattes, München, DE;

Sebastian Sattler, München, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test device and method is disclosed. In one embodiment, the test device includes a precision signal generator for generating a test signal, which generator is connected via a respective connecting line to a respective input contact intended for connection to an input of an integrated circuit, and at least one reference signal generator for generating a reference signal. Furthermore, at least one comparator unit is provided for a respective input contact said comparator unit being able to be operated in a test mode. In the test mode, the test signal is compared with the reference signal. The precision signal generator is turned off by the comparator unit if the test signal exceeds or falls below the reference signal.


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