The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Jun. 01, 2006
Applicant:
Kostadin Doytchinov, Ottawa, CA;
Inventor:
Kostadin Doytchinov, Ottawa, CA;
Assignee:
Quality Vision International, Inc., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
Measurement data collected within a measurement frame of reference is fitted to geometric tolerance zones having regard for the uncertainties of the measurement. Geometric freedoms for fitting the measurement data are exploited to fit uncertainty zones associated with the measurement data within the tolerance zones. Typically, the measurement data is multidimensional and the uncertainty zones have different sizes.
Doytchinov, Kostadin. (2008). Fitting multidimensional measurement data to tolerance zones having regard for the uncertainty of the measurements (U.S. Patent No. 7400992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7400992
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile