The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
May. 29, 2003
Chan Sheng Liu, State College, PA (US);
Fei Gao, State College, PA (US);
Chan Sheng Liu, State College, PA (US);
Fei Gao, State College, PA (US);
Other;
Abstract
A method for detecting DNA variation. First, by aligning trace data of a sample DNA sequence to trace data of a reference DNA sequence to produce an aligned sample DNA sequence. Then, inputting the trace data of the bases of both the reference DNA sequence and the aligned sample DNA sequence for a particular frame number into a non-linear mathematical function of an anti-correlation calculation scheme for all the frame numbers. Minimal values will be produced at the particular frame number for DNA base trace data of the aligned sample DNA sequence which are not a variation as compared to the reference DNA sequence. Values above the minimal values will be produced at the particular frame number for DNA base trace data of the aligned sample DNA sequence which are a variation as compared to the reference DNA sequence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile