The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Mar. 23, 2004
Kenichi Torii, Arakawa, JP;
Takao Naito, Kawasaki, JP;
Hiroshi Nakamoto, Kawasaki, JP;
Toru Katagiri, Kawasaki, JP;
Kenichi Torii, Arakawa, JP;
Takao Naito, Kawasaki, JP;
Hiroshi Nakamoto, Kawasaki, JP;
Toru Katagiri, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The present invention has an object to provide a technology for monitoring the quality of a WDM signal light, capable of quickly and accurately judging an occurrence of quality deterioration of signal light and a deterioration factor thereof. To this end, according to a quality monitoring apparatus of WDM signal light of the present invention, a part of the WDM signal light being propagated through an optical transmission path is branched as a monitor light, a signal light of one wavelength contained in the monitor light is selected as a channel to be measured. Then, the frequency of occurrences of bit error for the channel to be measured is repeatedly measured for a plurality of times, and whether or not the signal quality is deteriorated is judged, together with the deterioration factor based on the measurement results, and a control signal light for adjusting the signal light power according to the judgment result is transmitted to the optical transmission path, to achieve the improvement of a characteristic of the WDM signal light.