The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Oct. 27, 2004
Philippe Guichard, Chabeuil, FR;
Jean-louis Le Corre, Roche sur Grane, FR;
Jean-marie Odermath, Beauvallon, FR;
Jérôme Inglese, Guilherand, FR;
Philippe Guichard, Chabeuil, FR;
Jean-Louis Le Corre, Roche sur Grane, FR;
Jean-Marie Odermath, Beauvallon, FR;
Jérôme Inglese, Guilherand, FR;
Thales, Neuilly Sur Seine, FR;
Abstract
The invention relates to electronic sensors comprising an electromechanical microsensor cell such as a micro-accelerometer, and it more particularly relates to the way in which the microsensor cell per se is mounted in a package that furthermore comprises a printed circuit board carrying the electronic processing circuits associated with the microsensor cell. In order to establish a non-rigid electrical connection between a conductive terminal of the board and a connection pin of the cell, a narrow strip-shaped conductive connection cut by chemical machining from a thin and flexible metal sheet (CuBe) is soldered. The strip comprises at least one circle-arc segment extending over one half-turn or three-fourths of a turn. Its resilience permits very low stiffness in all directions and therefore prevents any transmission of vibrations or shocks to the cell. The manufacture of the connections may be collective for all the connections of a sensor and for successive sensors manufactured serially. Application to accelerometers subjected to large shock and vibration stresses.