The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Feb. 27, 2006
Applicants:
Kenta Mikuriya, Tokyo, JP;
Takashi Yoshida, Tokyo, JP;
Takayuki Kei, Tokyo, JP;
Inventors:
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A confocal microscope uses fluorescent or reflected light obtained by irradiating a plurality of beam spots to a sample so as to observe the sample. The confocal microscope has a phase modulator element which modulates phase of laser light to form the beam spots, a liquid crystal element which forms a plurality of pinholes through which only the fluorescent or the reflected light is transmitted, and a control section which controls the phase modulator element and the liquid crystal element.