The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Mar. 28, 2003
Pawel Drabarek, Tiefenbronn, DE;
Dominique Breider, Ecublens, CH;
Marc-henri Duvoisin, Préverenges, CH;
Dominique Marchal, Vallorbe, CH;
Pawel Drabarek, Tiefenbronn, DE;
Dominique Breider, Ecublens, CH;
Marc-Henri Duvoisin, Préverenges, CH;
Dominique Marchal, Vallorbe, CH;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An interferometric measuring device for recording the shape, the roughness or the clearance distance of the surface of a measured object is provided, the measuring device having a modulating interferometer, to which is supplied short-coherent radiation by a radiation source, and which has a first beam splitter for splitting the radiation supplied into a first beam component guided via a first arm, and into a second beam component guided via a second arm. One beam is shifted with respect to the other beam, with the aid of a modulating device, in terms of the beam's light phase or light frequency, and passes through a delay line. The two beams are subsequently combined at an additional beam splitter of the modulating interferometer. A measuring probe that is spatially separated from the modulating interferometer is coupled to it or able to be coupled to it via a light-conducting fiber set-up, in which probe the combined beam components are split into a measuring beam guided to the surface by a probe-optical fiber unit having a slantwise exit surface on the object side and a reference beam. An accurate surface measurement is facilitated by the angle of inclination of the exit surface to the normal of the optical probe axis amounting to at least 46°.