The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Dec. 16, 2005
Applicants:
Debra D. Wawro, Arlington, TX (US);
Sorin Tibuleac, Norcross, GA (US);
Robert Magnusson, Arlington, TX (US);
Inventors:
Debra D. Wawro, Arlington, TX (US);
Sorin Tibuleac, Norcross, GA (US);
Robert Magnusson, Arlington, TX (US);
Assignee:
Board of Regents, The University of Texas System, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods of detecting one or more parameters of a medium are disclosed. The methods include providing a waveguide grating device, contacting the waveguide grating with a medium, propagating a signal having at least one signal attribute through the waveguide, and comparing the modified signal attribute to a known signal attribute to detect a parameter of the medium.