The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
May. 17, 2005
Harold E. Hager, Bellevue, WA (US);
William D. Sherman, Renton, WA (US);
Harold E. Hager, Bellevue, WA (US);
William D. Sherman, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Apparatus and methods for calibrating an optical detector. In one embodiment an optical reference apparatus includes a body having an outer surface. At least a portion of the outer surface has a reflectance that can vary. The optical reference apparatus is adapted to be deployed with a cloud of optical sensors and has a terminal velocity that is about the same as the terminal velocity of the sensors. Further, the variation of the reflectance can be caused by a rotation of the optical reference apparatus (caused by an aerodynamic member). The sensors may be made from porous silicon and the optical reference apparatus may include a retroreflector. The apparatus also provides a method of referencing an optical signal. The method includes deploying an optical reference apparatus with a cloud of sensors and detecting a variation in its reflectance.