The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Feb. 15, 2007
Eng Keong Ho, Ang Mo Kio, SG;
Eng Keong Ho, Ang Mo Kio, SG;
Systems On Silicon Manufacturing Co. Pte. Ltd., Singapore, SG;
Abstract
A system for identifying systematic yield losses comprises a device configured to test produced products using a test sequence that produces yield data related to a wafer. The wafer is divided into multiple zones. Series of yield data may be collected and stored for each zone. A first data series Ris the yield of a zone; a second data series Ris a p consecutive element moving average of data series R; and a third data series Ris a p consecutive element moving standard deviation of data series R. A device is configured to calculate a trigger point for each element of R, wherein the trigger point is calculated as the respective Relement less an adjusted respective Rvalue. A notification may be provided to a user when the trigger point calculated for each element of Ris greater than the respective element of R