The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Sep. 06, 2006
Shih-chang Wu, Hsinchu Hsiang, TW;
Hendra Sudin, Hsinchu Hsiang, TW;
Hsin-hung Lin, Hsinchu Hsiang, TW;
Ming-chi Chen, Hsinchu Hsiang, TW;
Shih-Chang Wu, Hsinchu Hsiang, TW;
Hendra Sudin, Hsinchu Hsiang, TW;
Hsin-Hung Lin, Hsinchu Hsiang, TW;
Ming-Chi Chen, Hsinchu Hsiang, TW;
MJC Probe Incorporation, Chu-Pei, Hsinchu Hsiang, TW;
Abstract
A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a plurality of probes inserted through the guide plates and the probe holder plate in such a manner that the probes are flexible within the accommodation chamber. One of the guide plates has at least one through hole. The probe holder plate is slightly moveable in horizontal and vertical directions but fixable to one of the guide plats under a force applied through the at least one through hole to the probe holder plate while the other of the guide plates is removed, thereby preventing damage of the probes or movement of the probes during a maintenance work.