The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Jul. 13, 2006
Applicants:

Walter Mruk, Chatham, NJ (US);

Martin Adams, Chatham, NJ (US);

William Kilkerr, Kettering, GB;

Nicholas Bell, Desborough, GB;

Robert Barnacle, Chester, NJ (US);

Inventors:

Walter Mruk, Chatham, NJ (US);

Martin Adams, Chatham, NJ (US);

William Kilkerr, Kettering, GB;

Nicholas Bell, Desborough, GB;

Robert Barnacle, Chester, NJ (US);

Assignee:

DataOnline, L.L.C., Berkeley Heights, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 21/49 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection system for determining material level in a container where the container has an opening and an optical window mounted to the opening. A sensor element is mounted to the container adjacent the window. The sensor element has an optical emitter and an optical receiver positioned to form a triangular vertex with the material surface level within the container.


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