The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Feb. 14, 2006
Philip T. Feldsine, Mercer Island, WA (US);
Tim A. Kelly, Bellevue, WA (US);
Jim Christensen, Portland, OR (US);
Joseph B. Di Carlo, Long Beach, CA (US);
Mark Andersen, Pasadena, CA (US);
Anita Kressner, Bellevue, WA (US);
Philip T. Feldsine, Mercer Island, WA (US);
Tim A. Kelly, Bellevue, WA (US);
Jim Christensen, Portland, OR (US);
Joseph B. Di Carlo, Long Beach, CA (US);
Mark Andersen, Pasadena, CA (US);
Anita Kressner, Bellevue, WA (US);
Biocontrol Systems Inc., Bellevue, WA (US);
Abstract
Methods and apparatus for evaluating the quality of a sample of a product, an ingredient, an environment or process by measuring multiple parameters thereof, including light emitted from a reacting sample containing ATP, ADP, alkaline phosphatase or other parameters such as pH, temperature, conductivity, reduction potential, dissolved gases, specific ions, and microbiological count. The apparatus comprises an integrated sample testing device used to collect a sample, mix reagents, react the sample, and collect it in a measurement chamber. The apparatus also comprises an instrument having a photon detection assembly for use with the sample testing device. The instrument can also comprise one or more sensing probes and a communication port to facilitate data collection, transfer and analysis.