The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Feb. 14, 2006
Applicants:

Kejun Kang, Beijing, CN;

Haifeng HU, Beijing, CN;

Yali Xie, Beijing, CN;

Qitian Miao, Beijing, CN;

Yigang Yang, Beijing, CN;

Yuanjing LI, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Xuewu Wang, Beijing, CN;

Inventors:

Kejun Kang, Beijing, CN;

Haifeng Hu, Beijing, CN;

Yali Xie, Beijing, CN;

Qitian Miao, Beijing, CN;

Yigang Yang, Beijing, CN;

Yuanjing Li, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Xuewu Wang, Beijing, CN;

Assignees:

Tsinghua University, Beijing, P.R., CN;

Nuctech Company Limited, Beijing, P.R., CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method of discriminating materials by employing fast neutron and continuous spectral X-ray and an equipment for the same. The method comprising the steps of: (a) transmitting a fast neutron beam produced by a fast neutron source and a continuous spectral X-ray beam produced by a continuous spectral X-ray source through inspected objects; (b) directly measuring the intensity of the transmitted X-rays and the intensity of the transmitted neutrons by a X-ray detector array and a neutron detector array respectively; and (c) identifying the materials of the inspected object by Z-dependency curves formed by the attenuation differences between the neutron beam and X-ray beam transmitted through different materials of the inspected object. This direct measurement of transmitted dual-ray technique has much more efficient than secondary radiations measurement such as neutron activation analysis, has much more material discrimination sensitivity than dual-energy x-ray technique. The respective measurements of neutrons and x-rays make the usages of high detect efficiency neutron detectors and x-ray detectors possible. The using continuous spectral x-ray produced by Linac adds more advantages such as: high penetration ability, high spatial resolution, and high image quality over monoenergetic dual-ray technique.


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