The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Sep. 26, 2005
Applicants:

Ting-hui Huang, Gueishan Township, Taoyuan County, TW;

Kuo-kuei Lee, Gueishan Township, Taoyuan County, TW;

Chih-chiang Chen, Gueishan Township, Taoyuan County, TW;

Feng-lung Chang, Gueishan Township, Taoyuan County, TW;

Inventors:

Ting-Hui Huang, Gueishan Township, Taoyuan County, TW;

Kuo-Kuei Lee, Gueishan Township, Taoyuan County, TW;

Chih-Chiang Chen, Gueishan Township, Taoyuan County, TW;

Feng-Lung Chang, Gueishan Township, Taoyuan County, TW;

Assignee:

Au Optronics Corp., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection apparatus for detecting a defect in an array of a liquid crystal display, comprises a main chamber, a stage, a detection device and a main heater. The stage is disposed in the main chamber, and the array is placed on stage. The detection device is disposed in the main chamber and detects an electrical characteristic of the array. The main heater heats the array to a first temperature to reveal the defect of the array.


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