The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Nov. 07, 2006
Applicants:

Raanan A. Miller, Chestnut Hill, MA (US);

Evgeny Krylov, Billerica, MA (US);

Erkinjon G. Nazarov, Lexington, MA (US);

Gary A. Eiceman, Las Cruces, NM (US);

John A. Wright, Billerica, MA (US);

Inventors:

Raanan A. Miller, Chestnut Hill, MA (US);

Evgeny Krylov, Billerica, MA (US);

Erkinjon G. Nazarov, Lexington, MA (US);

Gary A. Eiceman, Las Cruces, NM (US);

John A. Wright, Billerica, MA (US);

Assignee:

Sionex Corporation, Bedford, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for analyzing one or more ion species of a sample including a first ion mobility filter associated with a first flow path for passing first ions of the sample, a second ion mobility filter associated with a second flow path for passing second ions of the sample, a first outlet from the first flow path for passing a portion of the first ions from the first flow path to the second flow path, and a first outlet from the second flow path for removing neutral particles from the second flow path where the first outlet from the second flow path is upstream of the second ion mobility filter in relation to the ion flow in the second flow path.


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