The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2008

Filed:

Sep. 19, 2005
Applicants:

Edward Henry Chao, Oconomowoc, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Tanvi Kachhy, Milwaukee, WI (US);

Bruce Matthew Dunham, Mequon, WI (US);

Abdelaziz Ikhlef, Waukesha, WI (US);

Inventors:

Edward Henry Chao, Oconomowoc, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Tanvi Kachhy, Milwaukee, WI (US);

Bruce Matthew Dunham, Mequon, WI (US);

Abdelaziz Ikhlef, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01); G21K 1/02 (2006.01); G21K 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring an alignment of a detector is described. The method includes determining, by a processor, the alignment of the detector with respect to a collimated radiation beam. The determination of the alignment is based on a plurality of signals from a first cell of the detector and a second cell of the detector, and is independent of a shape of the collimated radiation beam.


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