The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Mar. 30, 2005
Hea Joung Kim, Irvine, CA (US);
Paul Anthony Lettieri, Lake Forest, CA (US);
Brima Ibrahim, Aliso Viejo, CA (US);
Siukai Mak, Poway, CA (US);
Hea Joung Kim, Irvine, CA (US);
Paul Anthony Lettieri, Lake Forest, CA (US);
Brima Ibrahim, Aliso Viejo, CA (US);
Siukai Mak, Poway, CA (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Certain aspects of determining a signal quality metric in event of a CRC false positive may comprise measuring an amplitude and/or phase of at least a portion of a phase shift keyed section of a frame. The measured amplitude and/or phase may be checked to determine if it lies within a range of a reference amplitude and/or phase respectively. An amplitude and/or phase counter may be incremented if the measured amplitude and/or phase lies outside the range of the reference amplitude and/or phase respectively. A confidence level value of a cyclic redundancy check (CRC) for at least a portion of the phase shift keyed section of the frame may be determined based on a determined value of the incremented amplitude and/or phase counter.