The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Sep. 06, 2005
Martin Brox, München, DE;
Robert Kaiser, Kaufering, DE;
Volker Kilian, München, DE;
Wolfgang Spirkl, Germering, DE;
Martin Brox, München, DE;
Robert Kaiser, Kaufering, DE;
Volker Kilian, München, DE;
Wolfgang Spirkl, Germering, DE;
Infineon Technologies AG, Munich, DE;
Abstract
The invention relates to a method for testing a memory device with the memory device being able to be operated in a normal operating mode and a test mode and encompassing an output driver, input driver, and data pads. The method includes the steps of communicating test input data to be used for a test to the memory device, performing a test using the test input data in order to obtain test output data, the test data read out being passed via an output driver, at least one data pad, and an input driver, wherein the input drivers and output drivers are switched during the test in such a way as to enable data to be simultaneously read from and written to the memory device, and creating a data test result from the test output data. Furthermore, the invention relates to a memory device and a system for testing a memory device.