The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2008

Filed:

Jun. 30, 2005
Applicants:

Marc Daskalovic, Concord, NH (US);

Eugene Zarakhovsky, Seattle, WA (US);

Christian Eric Schrock, New York, NY (US);

Inventors:

Marc Daskalovic, Concord, NH (US);

Eugene Zarakhovsky, Seattle, WA (US);

Christian Eric Schrock, New York, NY (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06E 1/00 (2006.01); G06E 3/00 (2006.01); G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 15/18 (2006.01); G06G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided to match an unknown data point with a known data point contained in a multi-dimensional data structure. The method may include receiving data from any multi-dimensional source where a query may be used to locate specific data points within that source. The method receives a number of inputs, including a Euclidean error distance and a number of reference points to use. Furthermore, the method determines optimal reference points to locate a relatively small number of data points within the data structure that possibly match the unknown point. Once possible match points are located, the method then determines the unknown point's match.


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