The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Apr. 20, 2005
Ilya Gluhovsky, Mountain View, CA (US);
Jan L. Bonebakker, Mountain View, CA (US);
Ilya Gluhovsky, Mountain View, CA (US);
Jan L. Bonebakker, Mountain View, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
One embodiment of the present invention provides a system that computes a distance metric between computer system workloads. During operation, the system receives a dataset containing metrics that have been collected for a number of workloads of interest. Next, the system uses splines to define bases for a regression model which uses a performance indicator y as a response and uses the metrics (represented by a vector x) as predictors. The system then fits the regression model to the dataset using a penalized least squares (PLS) criterion to obtain functions f, . . . , f, which are smooth univariate functions of individual metrics that add up to the regression function f, such that y=f(x)+ε= wherein ε represents noise. Finally, the system uses the fitted regression function to define the distance metric.