The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
May. 04, 2005
Applicants:
Jose Marcos Laraia, Pocatello, ID (US);
David John Willis, Murray, UT (US);
Inventors:
Jose Marcos Laraia, Pocatello, ID (US);
David John Willis, Murray, UT (US);
Assignee:
AMI Semiconductor, Inc., Pocatello, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Sensors and/or transducers can exhibit nonlinear response to temperature changes in terms of offset and also in terms of sensitivity to variations in a sensed physical attribute (pressure, strain, displacement, etc.). Padé Approximant function emulators are used to model the nonlinear offset and/or nonlinear sensitivity behaviors of a given sensing device relative to one or more temperature sub-ranges and to produce temperature compensating corrections for offset and/or sensitivity as may be desired.