The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Jan. 06, 2006
Eric A. Steinhilper, Harrison Township, MI (US);
Eric A. Steinhilper, Harrison Township, MI (US);
GM Global Technology Operations, Inc., Detroit, MI (US);
Abstract
Described is a method and system for analyzing throughput of a production line. The method includes selecting among the stations, a set of susceptible stations that are affected by at least one selected event, ranking the susceptible stations with respect to a selected event and the predetermined criteria to determine an ordered list of more susceptible stations, altering the selected events to generate a new set of events, reranking the susceptible stations with respect to the selected events comprising the new event to determine a new ordered list of more susceptible stations and determining the most susceptible station based on a comparison criterion of the original ordered list of more susceptible stations and the new ordered list of more susceptible stations.