The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Jun. 15, 2007
Lothar Wenzel, Round Rock, TX (US);
Nicolas Vazquez, Austin, TX (US);
Kevin L. Schultz, Georgetown, TX (US);
Dinesh Nair, Austin, TX (US);
Lothar Wenzel, Round Rock, TX (US);
Nicolas Vazquez, Austin, TX (US);
Kevin L. Schultz, Georgetown, TX (US);
Dinesh Nair, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.