The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Apr. 10, 2003
Peter-michael Merbach, Zella-Mehlis, DE;
Rudolf Hauke, Niederstotzingen, DE;
Hans-peter Nothaft, Neu-Ulm, DE;
Peter-Michael Merbach, Zella-Mehlis, DE;
Rudolf Hauke, Niederstotzingen, DE;
Hans-Peter Nothaft, Neu-Ulm, DE;
TBS Holding AG, Pfaeffikon, CH;
Abstract
A method for detecting data of an uneven surface of an object includes the following steps: illuminating at least one of stripes and a grid on the uneven surface using at least one light source; detecting, without a touching contact, light reflected from the uneven surface at a plurality of discrete locations so as to create a partial image of the uneven surface at each of the plurality of discrete locations; selectively analyzing each of the partial images; and combining at least portions of the partial images into an overall image of the uneven surface.