The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2008

Filed:

Nov. 22, 2004
Applicant:

Yasumasa Tomita, Tokyo, JP;

Inventor:

Yasumasa Tomita, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning device for scanning surfaces of an even number of photoconductors simultaneously includes a rotating deflecting device arranged substantially at a center in a housing to deflect optical beams, and a plurality of scanning optical systems corresponding to the even number of photoconductors, arranged to be substantially symmetrical with the rotating deflecting device as a symmetry center. The plurality of scanning optical systems include a plurality of folding-back mirrors and at least one long lens having power in a sub-scanning direction, respectively, and the pluralities of folding-back mirrors and the at least one long lenses of the symmetrically arranged scanning optical systems are arranged to be symmetrical to each other with the rotating deflecting device as the symmetry center, respectively.


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