The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Aug. 23, 2006
Edward W. Stark, New York, NY (US);
Edward W. Stark, New York, NY (US);
Other;
Abstract
A method, system and apparatus for improving at least one of a) optical interactance measurements, b) optical transmittance measurements and c) optical reflectance measurements. The apparatus has a probe having a body portion and an tip portion. The body portion has a central tubular element having an opening therethrough. The tip portion has a central aperture and a number that is a plurality of ring openings therein. At least some of the plurality of rings are angled with respect to a longitudinal axis of the probe. A plurality of fiber optic bundles corresponds in number at least to the number of ring openings, and at least one fiber optic bundle is arranged at one end of the longitudinal axis for receiving specimen information and at another end of the longitudinal axis connected to a detector for receiving a signal.