The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7397560 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 08, 2008

Filed:

Apr. 04, 2006
Applicants:

Karen L. Seaward, Palo Alto, CA (US);

David T. Dutton, San Jose, CA (US);

Inventors:

Karen L. Seaward, Palo Alto, CA (US);

David T. Dutton, San Jose, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/443 (2006.01); G01N 21/73 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
Abstract

A contamination detector in accordance with one embodiment of the invention includes a plasma generation system operable to direct an atmospheric plasma discharge towards a surface. The contamination detector further includes a light capture system to capture light generated by interaction of the atmospheric plasma discharge with the surface. The light capture system guides the captured light to an optical detection system configured to detect a contaminant.


Find Patent Forward Citations

Seaward, Karen. (2008). Surface contamination detection (U.S. Patent No. 7397560). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7397560

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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