The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Sep. 28, 2005
Applicants:
Vance D. Archer, Eatontown, NJ (US);
Daniel P. Chesire, Winter Garden, FL (US);
Seung H. Kang, Sinking Spring, PA (US);
Taeho Kook, Orlando, FL (US);
Sailesh M. Merchant, Macungie, PA (US);
Inventors:
Vance D. Archer, Eatontown, NJ (US);
Daniel P. Chesire, Winter Garden, FL (US);
Seung H. Kang, Sinking Spring, PA (US);
Taeho Kook, Orlando, FL (US);
Sailesh M. Merchant, Macungie, PA (US);
Assignee:
Agere Systems, Inc., Allentown, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/485 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed herein are novel damage detection circuitries implemented on the periphery of a semiconductor device. The circuitries disclosed herein enable the easy identification of cracks and deformation, and other types of damage that commonly occur during test and assembly processes of semiconductor devices.