The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2008

Filed:

Feb. 02, 2007
Applicants:

Satoshi Tomimatsu, Kokubunji, JP;

Kaoru Umemura, Musashino, JP;

Yuichi Madokoro, Kokubunji, JP;

Yoshimi Kawanami, Kokubunji, JP;

Yasunori Doi, Kokubunji, JP;

Inventors:

Satoshi Tomimatsu, Kokubunji, JP;

Kaoru Umemura, Musashino, JP;

Yuichi Madokoro, Kokubunji, JP;

Yoshimi Kawanami, Kokubunji, JP;

Yasunori Doi, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A specimen fabrication apparatus, including: an ion beam irradiating optical system to irradiate a sample placed in a chamber, with an ion beam, a specimen holder to mount a specimen separated by the irradiation of the ion beam, a holder cassette to hold the specimen holder, and a sample stage to hold the sample and the holder cassette, wherein said holder cassette is transferred to outside of the chamber in a condition of holding said specimen holder with the specimen mounted.


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