The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2008

Filed:

Aug. 30, 2005
Applicants:

Reid A. Brennen, San Francisco, CA (US);

Tom a Van DE Goor, San Mateo, CA (US);

Gangqiang LI, Palo Alto, CA (US);

Kevin P. Killeen, Woodside, CA (US);

Inventors:

Reid A. Brennen, San Francisco, CA (US);

Tom A van de Goor, San Mateo, CA (US);

Gangqiang Li, Palo Alto, CA (US);

Kevin P. Killeen, Woodside, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention described herein provides a mass spectrometry system, having an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, a second gas source for supplying gas at a defined flow to the ionization region, and a detector downstream from the ion source for detecting ions produced by the ion source. The invention also provides an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, and a second gas source for supplying gas at a defined flow to the ionization region. A method for producing analyte ions is also disclosed. The method includes producing analyte ions from an ionization device, directing a first heated gas toward the analyte ions to desolvate the analyte ions, and directing a second gas toward the analyte ions at a defined and continual flow rate.


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