The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
Jul. 17, 2006
Applicants:
Richard K. Workman, Los Altos, CA (US);
Storrs T. Hoen, Brisbane, CA (US);
George M. Clifford, Jr., Los Altos Hills, CA (US);
Inventors:
Richard K. Workman, Los Altos, CA (US);
Storrs T. Hoen, Brisbane, CA (US);
George M. Clifford, Jr., Los Altos Hills, CA (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMs actuator may be determined in-situ by application of a force to the scanning probe microscope cantilever.
Workman, Richard. (2008). Force method for determining the spring constant of scanning probe microscope cantilevers using mems actuators (U.S. Patent No. 7395697). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7395697
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile