The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Dec. 25, 2005
Wei-hsiang Tseng, Taipei, TW;
Hsin-cheng Chen, Tainan Hsien, TW;
Ping-sheng Chen, Chia-Yi Hsien, TW;
Wei-Hsiang Tseng, Taipei, TW;
Hsin-Cheng Chen, Tainan Hsien, TW;
Ping-Sheng Chen, Chia-Yi Hsien, TW;
MediaTek Inc., Hsin-Chu Hsien, TW;
Abstract
A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.