The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Jun. 10, 2005
Applicants:

Guofei Jiang, Princeton, NJ (US);

Haifeng Chen, Plainsboro, NJ (US);

Cristian Ungureanu, Princeton, NJ (US);

Kenji Yoshihira, Cranford, NJ (US);

Inventors:

Guofei Jiang, Princeton, NJ (US);

Haifeng Chen, Plainsboro, NJ (US);

Cristian Ungureanu, Princeton, NJ (US);

Kenji Yoshihira, Cranford, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To determine the cause of a problem, evaluating and tracing how an individual request traverses through various components in the system makes possible new detection techniques. The present invention relates to detecting faults in a computer system. In accordance with an embodiment of the invention, a method and apparatus detects a fault in a system by receiving a request and generating a trace based on the request. The trace is a sequence of components used to service the request. The method and apparatus also compares the trace with a stored automaton to determine whether the trace is an anomaly. The stored automaton describes traces.


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