The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Oct. 31, 2002
Applicants:

Javed M. Khan, San Jose, CA (US);

Ching Hua Chien, San Jose, CA (US);

Robert Walter Droege, San Jose, CA (US);

Allen E. Dubberley, Los Gatos, CA (US);

Richard Arthur Wolters, Jr., San Jose, CA (US);

Inventors:

Javed M. Khan, San Jose, CA (US);

Ching Hua Chien, San Jose, CA (US);

Robert Walter Droege, San Jose, CA (US);

Allen E. Dubberley, Los Gatos, CA (US);

Richard Arthur Wolters, Jr., San Jose, CA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for providing receipt inspection reporting (RIR) allows for entry, modification, searching and reporting of RIR data. The RIR data is stored in a database and accessible online to facilitate tracking and analysis of defects and other problems. Searches and custom reports also may be generated to provide RIR tracking and analysis of problems. Logging and tracking of defects allows for root cause analysis using RIR data stored in a database to improve the RIR resolution process.


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